CHARACTERIZATION AND EFFECT OF THE INTROGRESSION OF Leymus racemosus INTO BREAD WHEAT

Abstract

Due to the high demand for wheat in the world, new technologies are currently being sought to increase its production, resistance to diseases, tolerance to different stresses and quality, among others. In this search, the introgression of genes through translocations between wild relatives and wheat has been one of the most successful breeding avenues. The objectives of the present study were to introgress and characterize, in lines of bread wheat, the translocation of Leymus racemosus using cytogenetic techniques and molecular markers, and to determine the effect of the translocation on leaf rust resistance compared to the recurrent parent. The translocation was located on the long arm of chromosome 5B of bread wheat Borlaug 100 and was designated as T5Lr#1L.5BL. The molecular marker wsnp_Ex_c5915-103 confirmed the presence of such translocation. Resistance tests in seedlings to leaf rust showed that the 38 lines with the translocation were susceptible, as was the recurrent parent.